Arbitrary waveform generator addresses EMI testing

March 25, 2015 // By Christoph Hammerschmidt
EMC and EMI instrumentation provider Teseq AG has introduced an eight-channel arbitrary waveform generator designed for automotive EMI immunity testing. The ARB 5500 fits inside the company's transient generator and features memory for over 64,000 standard waveform segments as well as 1 GB of Clone memory for user-defined shapes: Enough memory for several thousand hours of simulations, the vendor promises.

Available for both new systems as well as as an upgrade for existing NSG 5500 units, the ARB 5500 provides the necessary control for all battery simulation tests and advanced functions including power magnetics and continuous wave (ripple) simulations.  

According to Teseq, the ARB 5500 supports waveforms that may be difficult to describe and real-world events that need to be simulated. All vital waveforms can be created from the built-in wave shapes or by loading a Clone, a memory map of user-identified or prerecorded wave shapes, from an external application.

In addition to individual trigger outputs and programmable current limits, each of the instruments' eight channels supports 16-bit output with a 10 MS/s playback for continuously variable operation. The channels can be synchronized with a parameter-ramping function when paired with Teseq’s redesigned AutoStar 7 software, enabling Wysiwyg operation and drag-and-drop programming. All channels are individually calibrated with values stored locally.

Every segment in the arbitrary waveform generator features its own trigger, advanced rectification, phase angle and duty cycle programming to effortlessly meet even the most complex standards’ requirements.

The ARB 5500 has an output voltage range of -10V to +10V, a frequency range up to 500kHz with isolated output. With the addition of transient modules and a new dropout switch, nearly all automotive tests can be performed using a single 19in generator.
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