Four goals in V2X device testing
The main purpose of testing is to ensure that the design conforms to the design specifications from component-level design to the system level, and from the antenna RF performance to the protocol or security aspects. In general, tests fall into four different categories, each demanding a different approach:
Unlike other technologies, V2X devices involve a high number of protocol implementations, where each device vendor has decided to implement a different stack supporting ETSI, US or Japanese standards. At the early R&D stage, the implementation needs to be tested as well as the radio system for functionality and performance. This means that a complete test solution should include the following capability:
- evaluating response to real-world challenges such as radio channel impairments, obstacles to reception, and both deliberate and accidental cyber attacks
- including other on-board units (OBUs) and roadside units (RSUs) to scale up the complexity of the environment, and see how systems cope with a changing variety of V2X signals at once
- finding failure points by pushing the system beyond its limits, to evaluate its tolerances and discover how it behaves
- capturing how the device under test (DUT) behaves, with clear reporting to enable performance comparisons and confirm whether it responds as expected
- testing at component and system level including both software-in-the-loop (SiL) and hardware-in-the-loop (HiL) systems, as appropriate
With support for all three different protocol stack implementations (US, European and Japanese), the Anritsu V2X Message Analysis Software allows users to perform tests in detail and confirm device compliance to the local regulations. The software supports message decoding functions from the physical layer up to the application layer, displaying in a tree view the details of every packet captured during the test (Fig.1).
The Anritsu MS2830A/MS269xA Vector Signal Generator hardware can be used to generate or replicate live scenarios in the laboratory. Fading test scenarios such as those defined in ETSI TS 103 257 are also supported.